Electron Spectrometry in a Scanning Electron Microscope

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In Folder: Electron Energy Loss Spectroscopy in a Scanning Electron Microscope

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Electron Spectrometry in a Scanning Electron Microscope

Senior Design Showcase project, Wentworth Institute of Technology, College of Engineering and Computer Science, Department of Electrical and Computer Engineering, 2020

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title: Electron Spectrometry in a Scanning Electron Microscope

creator: ]Benjamin Slayton, John Simonaitis

subject: electron spectrometry, electron microscopy, charged particle optics

description: Electron spectrometry in a scanning electron microscope (SEM) allows measurements of electron-specimen interactions in lower energy ranges than typical transmission electron microscopes, and with easier user control of the specimen. This project is working in collaboration with a group at MIT to develop a spectrometer to measure energy loss phenomena in some of their SEM-based experiments.

publisher: The Douglas D. Schumann Library and Learning Commons, Wentworth Institute of Technology

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date: 2020

type: Poster

format: .pdf

identifier: A

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language: eng

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rights: https://rightsstatements.org/vocab/InC/1.0/

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Electron Spectrometry in a Scanning Electron Microscope

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